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Proceedings of 2009 International Workshop on Information Security and Application (IWISA 2009)

Qingdao, China, November 21-22, 2009

Editors: Feng Gao and Xijun Zhu

AP Catalog Number: AP-PROC-CS-09CN004

ISBN: 978-952-5726-06-0

Page(s): 615-617

Application of Wavelet Analysis Technology to Damage Detection of Acoustic Emission Signal

Zhi-gang Feng and Ming Wang

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The technology of acoustic emission (AE) signal full waveform acquisition provides possibility of source location based on waveform analysis. According to fault character of AE signal, a new approach based on node-amplitude transform is introduced to locate AE sources, that is, the peak of amplitude is damage location. Meanwhile, using wavelet analysis and compress technology to manage extracting signal, then the image can show damage location directly, clearly and accurately. The experimental result proves that the method is effective and easy operation.

Index Terms

acoustic emission (AE), wavelet transform, damage, location, node, amplitude

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