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Proceedings of the 2nd International Symposium on Information Processing (ISIP 2009)

Huangshan, China, August 21-23, 2009

Editors: Fei Yu, Jian Shu, and Guangxue Yue

AP Catalog Number: AP-PROC-CS-09CN002

ISBN: 978-952-5726-02-2 (Print), 978-952-5726-03-9 (CD-ROM)

Page(s): 205-208

Design and Development of a Open Frame RFID System Unite Test Platform

Gao Kun, He Yigang, Hou Zhouguo, Li Bin, She Kai, and Zhu Yanqing

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RFID (Radio Frequency Identification) System Test Platform has attracted considerable attention in recent years because it has a great impact on many kinds of trade applications. However, there is dearth of available open frame test platform for RFID system. In this paper, we propose a new design and implementation of an open frame RFID test platform by thorough research which applies to almost Industrial Scientific Frequency Bandwidth. The hardware and software design of open test platform are introduced in detail. This paper also describes how we extended the open frame RFID test platform to include support almost trade application, which makes the platform is superior flexible for many kinds of applications.

Index Terms

RFID, open frame, unite, test platform

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