JOURNAL OF SOFTWARE (JSW)

ISSN : 1796-217X

Volume : 4 Issue : 1 Date : February 2009

**Image Rectification Using Affine Epipolar Geometric Constraint**

Liansheng Sui, Jiulong Zhang, and Duwu Cui

Page(s): 26-33

Full Text: PDF (341 KB)

**Abstract**

To rapidly and accurately search the corresponding points along scan-lines, rectification of stereo

pairs are performed so that corresponding epipolar lines are parallel to the horizontal scan-lines

and the difference in vertical direction is zero. In this paper, the method to rectify image pairs could

be divided into three steps including projective transformation, affine transformation and shearing

transformation. The projective transformation matrix is computed under the affine epipolar geometry

constraint, and the values of unknown parameters are searched by an algorithm which does not

require the relative matrix be positive definite. In this paper, an optimization function is presented to

remove the difference in vertical direction and an algorithm is developed to estimate initial values of

some parameters such as scale weights and vertical offset.

**Index Terms**

image rectification, affine epipolar geometric constraint, epipolar geometry

ISSN : 1796-217X

Volume : 4 Issue : 1 Date : February 2009

Page(s): 26-33

Full Text: PDF (341 KB)

pairs are performed so that corresponding epipolar lines are parallel to the horizontal scan-lines

and the difference in vertical direction is zero. In this paper, the method to rectify image pairs could

be divided into three steps including projective transformation, affine transformation and shearing

transformation. The projective transformation matrix is computed under the affine epipolar geometry

constraint, and the values of unknown parameters are searched by an algorithm which does not

require the relative matrix be positive definite. In this paper, an optimization function is presented to

remove the difference in vertical direction and an algorithm is developed to estimate initial values of

some parameters such as scale weights and vertical offset.